Test pin, also known as probe, is an essential component in precision electrical testing. In the process of electronic circuit research and production, it is often necessary to test and analyze signal connectivity and quality. At this time, precision test pins are used to extract the signal without damage and provide it to the corresponding ICT or testing system for comprehensive analysis. The quality of the test pin greatly affects the accuracy and repeatability of the test. According to the application field, test pins are divided into conventional ICT probes, semiconductor test probes, RF high-frequency test probes, high-current probes, and battery contact probes. According to the structure of the probe, it can also be divided into conventional single-head spring pins, double-head BGA test pins, and needle sleeve adapter double-head pins. In the early stage of probe selection, several key parameters need to be considered, including the spacing of the test pins, the appropriate head type for the object being tested, the current carrying capacity, the movement stroke, and the required spring force.

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Home Products BS 1363-2 figure 1 test pin

BS 1363-2 figure 1 test pin

Product No: SMT-BS01

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Description

Test pin diameter: Φ1 mm
Test pin finger length: 20 mm
Reference standard: BS1363-2 Figure 1

BS 1363-2 Figure 1 Test Pin

Tags：BS 1363 , SMT-BS01