1 General

1.1 Scope and object

This International Standard(IEC61032) specifies details and dimensions of test probes intended to verify the protection provided by enclosures with regard to:
– protection of persons against access to hazardous parts inside the enclosure;
– protection of the equipment inside the enclosure against ingress of solid foreign objects.

SMT IP20T_AL

The object of this International Standard is:

– to bring together in one publication object probes and access probes currently specified in other standards, together with any necessary new probes;   
– to guide technical committees in the selection of finger probes;
– to encourage those concemed to specify test probes in accordance with those already specified in this International Standard rather than modify details and dimensions;
– to limit the further proliferation of types of test probe.

1.2 General recommendations

When selecting probes, priority should be given to IP code probes.
The use of other probes, particularly probes which are not specified in this International Standard, should be limited to cases where the use of an IP code probe is for some reason impractical.

NOTE 1-The selection of a test probe for a particular purpose is the responsibility of the relevant technical committees.
NOTE 2-Technical committees wishing to develop new probes or to modify existing probes should submit proposals to technical committee 70 for amendment of this standard.

Application of the probes, test conditions, acceptance conditions and the procedure in case of conflicting test results are the responsibility of the relevant product committee. Certificates based on test probes conforming to the first edition of IEC 61032 should remain valid.

2 Reférences normatives

The following normative documents contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were current. All standards are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. Members of CEl and ISO maintain the register of current International Standards.

CEI 60050(826): 1982, Vocabulaire Electrotechnique International (VEI)-Chapitre826: Instal-lations électriques des batiments.
CEI 60529: 1989, Degrés deprotection procurés par les enveloppes. (Code IP)
CEI 60536: 1976, Classification des matériels électriques et électroniques en cequi concerne la protection contre les chocs électriques.
ISO 4287-1: 1984, Rugosité de surface – Terminologie – Partie 1: Surface et ses paramètres.

IEC Articulating Finger Probe with Dynamometer 10N

Knurled Finger Diameter: 12 mm
Knurled Finger Length: 80 mm
Baffle Plate Diameter: 50 mm
Baffle Plate Length: 100 mm
Baffle thickness: 20 mm
Material: Stainless Steel.
Handle: Nylon
According to: IEC61032, IEC60335-1, IEC60529-2001, IRAM 4220-1, SASO/IEC60335-1, SASO IEC60950, IEC60950/EN60950.
Thrust: 10N

IEC 61032 ArticUL ating Finger Probe with Dynamometer 10N