Abstract:
Electrostatic discharge (ESD) is a leading cause of failure in semiconductor devices and integrated circuits (ICs). In the semiconductor industry, testing for ESD vulnerability is essential to ensure the durability and reliability of components. This paper explores the significance of Human Body Model (HBM) and Machine Model (MM) ESD simulators, with a focus on the LISUN ESD-883D HBM/MM ESD Simulators, which is designed specifically for testing ICs. We will examine the features, working principles, and advantages of these simulators in ESD testing, as well as provide detailed insights into their technical specifications and applications in semiconductor testing.
1. Introduction
In the manufacturing and testing of semiconductor devices and integrated circuits (ICs), electrostatic discharge (ESD) is one of the most common causes of failure. ESD can cause both immediate damage and long-term degradation of the devices’ performance. The need to test these devices for ESD tolerance has led to the development of specialized equipment such as the Human Body Model (HBM) and Machine Model (MM) ESD simulators.
This article will focus on the role of HBM and MM ESD simulators in testing semiconductor devices and ICs, highlighting the LISUN ESD-883D HBM/MM ESD Simulator. The simulator is specifically designed for evaluating the electrostatic discharge robustness of ICs, providing a controlled and reproducible testing environment.
2. Understanding ESD Models: HBM and MM
Electrostatic discharge can occur in various forms, but the HBM and MM are the two most commonly used models in testing semiconductor devices and ICs. Both models simulate different ESD events based on the discharge source and the associated energy levels.
• Human Body Model (HBM): The HBM is a widely used model that simulates the ESD event caused by human interaction with electronic devices. It is based on the assumption that a person’s body, charged to a certain voltage, discharges when it comes into contact with a device. The HBM typically consists of a 100 pF capacitor charged to a certain voltage, which discharges through a 1.5 kΩ resistor into the device under test (DUT). The HBM simulates the ESD energy a device would experience when touched by a human.
Key parameters of the HBM:
Capacitor: 100 pF
Resistor: 1.5 kΩ
Typical voltage: 0-8 kV
• Machine Model (MM): The MM is another commonly used model that simulates the ESD event caused by contact with machines or conductive tools. The MM is based on the assumption that the discharge occurs from a machine or metal tool to a device under test, and it uses a 200 pF capacitor with a direct short (0 Ω resistance) to deliver the discharge. This model typically results in faster rise times and higher peak currents compared to HBM.
Key parameters of the MM:
Capacitor: 200 pF
Resistor: 0 Ω
Typical voltage: 0-500 V
3. Importance of HBM / MM ESD Simulators for Semiconductor Testing
The semiconductor industry faces constant pressure to improve the reliability and robustness of devices, especially in an era of miniaturization where ICs are becoming increasingly sensitive to ESD. Testing semiconductor devices for their susceptibility to ESD events is crucial to minimize field failures, extend product life, and ensure compliance with industry standards.
• Design Validation: HBM and MM ESD simulators help semiconductor manufacturers validate their designs, ensuring that devices can withstand potential ESD events during operation.
• Quality Assurance: ESD simulators ensure that semiconductor products meet industry standards, such as those set by JEDEC and IEC, for ESD tolerance.
• Failure Analysis: ESD simulators are also used to identify design flaws that might make devices more susceptible to electrostatic discharge.
The LISUN ESD-883D HBM/MM ESD Simulator is a cutting-edge tool designed for testing the ESD resilience of semiconductor devices and ICs. This simulator can generate both HBM and MM pulses, making it an ideal solution for comprehensive ESD testing in the semiconductor industry.
• Supports both HBM and MM models for flexible testing
• Adjustable voltage from 0 to 15 kV for HBM and 0 to 500 V for MM
• Multiple test modes including single, continuous, and automatic pulses
• Precision in pulse repetition, rise time, and discharge duration
• Safety features including over-voltage protection and short-circuit detection
• High accuracy in measuring and analyzing ESD events
Model | LISUN ESD-883D |
HBM Pulse Voltage | 0 – 15 kV |
MM Pulse Voltage | 0 – 500 V |
Capacitor (HBM) | 100 pF |
Capacitor (MM) | 200 pF |
Discharge Resistor | 1.5 kΩ (HBM) / 0 Ω (MM) |
Test Pulse Type | Single, Continuous, Automatic |
Pulse Duration | Adjustable, 100 ns – 1 μs |
Accuracy | ±1% |
The LISUN ESD-883D operates by charging a capacitor to a specified voltage and discharging it into the device under test. The simulator is designed to reproduce realistic electrostatic discharge events with precise control over pulse duration, voltage, and rise time. The HBM and MM pulses are generated based on industry standards, ensuring that devices are tested under conditions that accurately reflect real-world ESD scenarios.
5. Applications in Semiconductor and IC Testing
The LISUN ESD-883D is primarily used in the following applications:
• IC and Semiconductor Testing: The simulator is designed to assess the electrostatic discharge resistance of ICs, transistors, diodes, and other semiconductor components.
• Compliance Testing: It helps manufacturers ensure that their products meet global standards for ESD tolerance, including JEDEC, IEC, and ISO standards.
• Failure Analysis: By applying ESD pulses to a DUT, manufacturers can simulate real-world ESD conditions and observe potential failure modes, enabling them to make necessary design adjustments.
• Product Development: The LISUN ESD-883D assists engineers in identifying weaknesses in their semiconductor designs and making improvements to enhance ESD robustness.
6. Conclusion
HBM and MM ESD simulators are essential tools for testing the resilience of semiconductor devices and integrated circuits against electrostatic discharge. The LISUN ESD-883D HBM/MM ESD Simulators provides a comprehensive, flexible, and accurate solution for testing ICs and ensuring that they meet industry standards for ESD tolerance. With its advanced features, precise control, and robust performance, the LISUN ESD-883D is an invaluable asset in the semiconductor testing process.
References
“Electrostatic Discharge (ESD) and Semiconductor Devices,” IEEE Transactions on Device and Materials Reliability.
IEC 61000-4-2: Electrostatic Discharge Immunity Testing Standard.
LISUN ESD-883D Product Information, LISUN Group.
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