IEC 61032 Standard Articulated Test Probe with 10N Thrust

IECStandard Articulated Test Probe is a precision test probe made according to Figure 2 (Fig. 2) of the IEC61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL. IEC60335, IRAM 4220-1 and in most of the rules involved in the verification of accessibility to live parts.

The Jointed Test Finger was made on stainless steel and Polyamide handle.

Material: Stainless Steel.
Handle: Polyamide.
Finish: Chrome plating.
According to: IEC61032, IEC60335-1, IEC60529-2001, IRAM 4220-1, SASO/IEC60335-1, SASO IEC60950, IEC60950/EN60950.
Thrust: 10N

Standard:
IEC 61032 “Protection of persons and equipment by enclosures – Probes for verification” 
IEC 60335-1 “Household and similar electrical appliances – Safety – Part 1: General requirements”
IEC 60529 “Degrees of protection provided by enclosures (IP Code)”
IRAM 4220-1 “Medical Electrical Equipment Part 1: General requirements for safety”
IEC 60950-1 “Information technology equipment – Safety – Part 1: General requirements”

IEC 61032 Standard Articulated Test Probe with 10N Thrust

IEC 61032 Standard Articulated Test Probe with 10N Thrust