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Test Probe A of IEC 61032 – 50mm Sphere with Baffle and Handle

Product No: SMT-1201

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  • 50mm Sphere Test Probe A with Baffle and Handle

    Specification:

    IP1X Probe A /Test Probe A
    1. According to: IEC61032:1997 / IEC60529:2001.
    2. Test Probe A is necessary appliance for household and similar electrical appliance of against electric shock protection test.

    Technical Parameters:

    1. Ball Diameter:50 mm
    2. Baffle Plate Diameter:45 mm
    3. Baffle Plate Thickness: 4 mm
    4. Handle Diameter:10 mm
    5. Handle Length: 100 mm
    6. According to IEC61032 figure 1 (the Test probe A), table 6 IEC60529 the first characteristics

    Test Probe A of IEC 61032 – 50mm Sphere with Baffle and Handle

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  • SMT-1201 Calibrate Certificate